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 HITFET= BTS 3118 D
Smart Lowside Power Switch
Features Logic Level Input Input Protection (ESD) Thermal shutdown Overload protection Short circuit protection Overvoltage protection Current limitation Analog driving possible Product Summary Drain source voltage On-state resistance Nominal load current Clamping energy VDS RDS(on) I D(Nom) EAS 42 100 2.4 2 V m A J
HITFET
Current Limitation
In Pin 1
OvervoltageProtection
Gate-Driving Unit Overtemperature Protection
ESD
Overload Protection
Short circuit Protection
Pin 3 Source
Page 1

Application
All kinds of resistive, inductive and capacitive loads in switching or linear applications C compatible power switch for 12 V DC applications Replaces electromechanical relays and discrete circuits technology. Fully protected by embedded
Vbb
General Description
N channel vertical power FET in Smart SIPMOS protection functions.
M Drain Pin 2 and 4 (TAB)
2002-09-04
BTS 3118 D Maximum Ratings at T j = 25C, unless otherwise specified Parameter Drain source voltage Drain source voltage for short circuit protection T j = -40...150C Continuous input current VIN < -0.2V or VIN > 10V Operating temperature Storage temperature Power dissipation T C = 85 C 6cm 2 cooling area , T A = 85 C Unclamped single pulse inductive energy 1) Load dump protection VLoadDump2) = V A + VS EAS VLD Tj Tstg Ptot 21 1.1 2 58 J V IIN no limit -40 ...+150 -55 ... +150 W mA Symbol VDS VDS(SC) Value 42 20 Unit V
Electrostatic discharge voltage (Human Body Model) VESD according to MIL STD 883D, method 3015.7 and EOS/ESD assn. standard S5.1 - 1993 DIN humidity category, DIN 40 040 IEC climatic category; DIN IEC 68-1 Thermal resistance junction - case: SMD: junction - ambient @ min. footprint @ 6 cm2 cooling area 3) RthJC RthJA
1 Not tested, specified by design. 2VLoaddump is setup without the DUT connected to the generator per ISO 7637-1 and DIN 40839 3 Device on 50mm*50mm*1.5mm epoxy PCB FR4 with 6cm2 (one layer, 70m thick) copper area for drain connection. PCB mounted vertical without blown air.
RL = 6
, VA = 13.5 V
VIN = 0 and 10 V, t d = 400 ms, RI = 2
, 2 kV
E 40/150/56
3 115 55
Page 2
-0.2V
VIN
10V
| IIN |
2 C
K/W
2002-09-04
BTS 3118 D Electrical Characteristics Parameter at Tj = 25C, unless otherwise specified Characteristics Drain source clamp voltage Tj = - 40 ...+ 150, ID = 10 mA Off-state drain current Tj = -40 ... +150C VDS = 32 V, VIN = 0 V Input threshold voltage ID = 0.3 mA, Tj = 25 C ID = 0.3 mA, Tj = 150 C On state input current On-state resistance VIN = 5 V, ID = 2.2 A, Tj = 25 C VIN = 5 V, ID = 2.2 A, Tj = 150 C On-state resistance VIN = 10 V, ID = 2.2 A, Tj = 25 C VIN = 10 V, ID = 2.2 A, Tj = 150 C Nominal load current Tj < 150C, VIN = 10 V, TA = 85 C, SMD 1) Nominal load current VIN = 10 V, VDS = 0.5 V, TC = 85 C, Tj < 150C Current limit (active if VDS>2.5 V)2) VIN = 10 V, VDS = 12 V, tm = 200 s ID(lim) 10 15 20 ID(ISO) ID(Nom) 2.4 3.5 RDS(on) 70 130 100 200 A IIN(on) RDS(on) 90 160 120 240 VIN(th) 1.3 0.8 1.7 10 2.2 30 A m V IDSS 1.5 10 A VDS(AZ) 42 55 V Symbol min. Values typ. max. Unit
1@ 6 cm 2 cooling area 2Device switched on into existing short circuit (see diagram Determination of I D(lim)). If the device is in on condition and a short circuit occurs, these values might be exceeded for max. 50 s. Page 3
2002-09-04
BTS 3118 D Electrical Characteristics Parameter at Tj = 25C, unless otherwise specified Dynamic Characteristics Turn-on time VIN to 90% I D: t on t off -dV DS/dt on dV DS/dt off 40 70 0.4 0.6 100 100 1.5 1.5 V/s s , VIN = 0 to 10 V, Vbb = 12 V Turn-off time VIN to 10% ID: Symbol min. Values typ. max. Unit
Protection Functions1) Thermal overload trip temperature Input current protection mode Input current protection mode Tj = 150 C Unclamped single pulse inductive energy 2) ID = 2.2 A, Tj = 25 C, Vbb = 12 V EAS 2 J Tjt IIN(Prot) IIN(Prot) 150 60 175 120 100 300 300 C A
Inverse Diode
Inverse diode forward voltage IF = 10.9 A, tm = 250 s, VIN = 0 V, tP = 300 s VSD 1.0 V
1Integrated protection functions are designed to prevent IC destruction under fault conditions described in the data sheet. Fault conditions are considered as "outside" normal operating range. Protection functions are not designed for continuous repetitive operation. 2 Not tested, specified by design. Page 4
RL = 4.7
RL = 4.7
, VIN = 0 to 10 V, Vbb = 12 V Slew rate off 50 to 70% Vbb: , VIN = 10 to 0 V, Vbb = 12 V
RL = 4.7
, VIN = 10 to 0 V, Vbb = 12 V Slew rate on 70 to 50% Vbb:
RL = 4.7
2002-09-04
BTS 3118 D
Block diagram
Terms Inductive and overvoltage output clamp
RL
V
I IN 1 IN HITFET S 3 D 2 ID VDS Vbb
Z
D
S
VIN
HITFET
Input circuit (ESD protection)
V
Gate Drive Input
Short circuit behaviour
IN
I
IN
t
Source/ Ground
I
D
t
T
t
j
t
Page 5
2002-09-04
BTS 3118 D 1 Maximum allowable power dissipation Ptot = f(TC) resp. Ptot = f(TA) @ R thJA=55 K/W
3
2 On-state resistance RON = f(Tj); I D=2.2A; V IN=10V
225
m
W Rthjc = 3 K/W
max.
175
Ptot
2
SMD @ 6cm2
RDS(on)
150 125 100
typ.
1.5
1
75 50
0.5
25
0 -50
-25
0
25
50
75
100
C
150
0 -50
-25
0
25
50
75
100 125 C
175
TA;TC
Tj
3 On-state resistance RON = f(Tj); ID =2.2A; VIN=5V
250
4 Typ. input threshold voltage VIN(th) = f(T j); ID = 0.3 mA; V DS = 12V
2
V
m
200
max.
1.6
RDS(on)
175
typ.
VGS(th)
1.4 1.2 1 0.8 0.6 0.4 0.2
150 125 100 75 50 25 0 -50 100 125 C
-25
0
25
50
75
175
0 -50
-25
0
25
50
75
100
C
150
Tj
Page 6
Tj
2002-09-04
BTS 3118 D 5 Typ. transfer characteristics ID=f(VIN ); VDS=12V; TJstart=25C
16
A
6 Typ. short circuit current I D(lim) = f(Tj); VDS=12V Parameter: VIN
24
A
12
20
ID
ID
10
18
8 16 6 14
Vin=10V
4
2
12
5V
0 1
2
3
4
5
6
7
8
V
10
10 -50
-25
0
25
50
75
100 125 C
175
VIN
Tj
7 Typ. output characteristics ID=f(VDS ); TJstart =25C Parameter: VIN
20
A 7V Vin=10V
8 Typ. off-state drain current IDSS = f(Tj )
11
A max.
16 14
6V 5V
9 8
I DSS
ID
12 10 8
4V
7 6 5 4
6 4 2 0 0
V
3V
3 2 1
typ.
1
2
3
4
6
0 -50
-25
0
25
50
75
100 125 C
175
VDS
Page 7
Tj
2002-09-04
BTS 3118 D 9 Typ. overload current ID(lim) = f(t), Vbb =12 V, no heatsink Parameter: Tjstart
25
10 Typ. transient thermal impedance Z thJA=f(tp) @ 6 cm2 cooling area Parameter: D=tp/T
10 2
K/W D=0.5 0.2 0.1
A I D(lim)
-40C
10 1
25C
ZthJA
15
85C
10 0
0.05 0.02 0.01
10
+150C
10 -1
5
10 -2
Single pulse
0 0
0.5
1
1.5
2
2.5
3
3.5
4
ms t
5
10 -3 -8 -7 -6 -5 -4 -3 -2 -1 0 1 2 10 10 10 10 10 10 10 10 10 10 10
s 10
4
tp
11 Determination of ID(lim) ID(lim) = f(t); tm = 200s Parameter: TJstart
25
A
I D(lim)
-40C
15
25C 85C
10
5
150C
0 0
0.1
0.2
0.3
0.4
ms
0.6
t
Page 8
2002-09-04
BTS 3118 D
Package P-TO252-3-1
6.5 +0.15 -0.10 A
1 0.1
Ordering Code Q67060-S6325-A101
2.3 +0.05 -0.10 B 0.9 +0.08 -0.04
5.4 0.1
0.8 0.15
9.9 0.5 6.22 -0.2
0.51 min
0.15 max per side
3x 0.75 0.1 2.28
0...0.15 0.5 +0.08 -0.04 1 0.1
4.57
0.25
M
AB
0.1
GPT09051
All metal surfaces tin plated, except area of cut.
Page 9
2002-09-04
BTS 3118 D
Published by Infineon Technologies AG, Bereichs Kommunikation St.-Martin-Strasse 53, D-81541 Munchen (c) Infineon Technologies AG 1999 All Rights Reserved. Attention please! The information herein is given to describe certain components and shall not be considered as warranted characteristics. Terms of delivery and rights to technical change reserved. We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein. Infineon Technologies is an approved CECC manufacturer. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office in Germany or our Infineon Technologies Reprensatives worldwide (see address list). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Page 10
2002-09-04


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